BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Defense Tech Base//Combined opportunity reminders//EN
CALSCALE:GREGORIAN
BEGIN:VEVENT
UID:opportunity-dsip:5ed92567a27e4e48bd5e201a00b1e4ff_86672@defensetechba
 se.com
DTSTAMP:20261013T013601Z
DTSTART;VALUE=DATE:20261021
DTEND;VALUE=DATE:20261022
SUMMARY:Confirm DSIP deadline: OSW26BZ06-NV026 Defect Metrology and Charg
 e Trapping Dynamics in Transfer-Doped Diamond Transistors
DESCRIPTION:Date-only reminder. Verify official submission time\, eligibi
 lity\, amendments and question windows. Source status: Open. DSIP calend
 ar date uses America/New_York. Check the topic page for separate questio
 n windows and amendments.
URL:https://www.dodsbirsttr.mil/topics/api/public/topics/5ed92567a27e4e48
 bd5e201a00b1e4ff_86672/details
END:VEVENT
END:VCALENDAR